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Low-Band Selection: How the WR430 Coaxial Input Standard Gain Horn Improves General Microwave Testing

2026,09,29
Coaxial Input Horn

Low-Band Selection: How the WR430 Coaxial Input Standard Gain Horn Improves General Microwave Testing

For general-purpose microwave testing in the L/S band (1.72–2.61 GHz), engineers need a reference antenna that is ready to use out of the box and delivers stable gain. Our WR430 coaxial input Standard Gain Horn is built for exactly this purpose.

Unlike waveguide-input models that require careful flange alignment, this Coaxial Input Horn comes with a standard N-type connector. A single coaxial cable is enough to link it to a signal generator or spectrum analyzer — no extra Waveguide Adapter needed. The copper-and-aluminum construction balances durability and portability, while the sea-grey finish holds up in both lab and field environments. At 15 dB gain, it delivers stronger directivity than lower-gain alternatives in this band, making it well suited for low-level signal reception and longer link verification.

When selecting an antenna, engineers often weigh a pure coaxial-input horn against a Combined Input Horn. The coaxial-only approach is plug-and-play and cost-effective for routine general-purpose testing. The combined-input option adds both waveguide and coaxial interfaces, which is useful when a system needs high-precision waveguide feed for some setups and flexible coaxial hookup for others. A complete test setup typically also calls for a Waveguide Load for terminal matching and calibration — it is worth confirming interface specifications and band coverage up front so you do not end up sourcing adapters after delivery.

As a Broadband Horn covering the L/S band, this antenna fits metrology, component evaluation, communication link checks, and teaching labs. Across its 1.72–2.61 GHz range, the VSWR holds at ≤1.5, giving measurement teams dependable, repeatable reference data whether in a university lab, a commercial test house, or an R&D facility.

We support customization across frequency band, connector type, and interface dimensions. Beyond the standard N-type connector, SMA and other options are available on request. Contact our engineering team to confirm the right configuration for your test system.

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Ms. Wang Huanling

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Ms. Wang Huanling

Phone/WhatsApp:

17392764966

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